Equipment:
| Hitachi 635nm single longitudinal mode diode laser |
| Lightwave LDX-3620 Ultra Low Noise Current Source |
| Lightwave LDT-5412 Temperature Controller |
| Burleigh WA-1000 Wavemeter |
| Instruments SA, Inc. spectrometer |
| Photo-multiplier tube (PMT) |
| high voltage power supply |
| oscilloscope |
| ammeter |
| isolator |
| Instruments SA, Inc. scan controller |
The Burleigh wavemeter measures
wavelengths of incident light using an internal Michelson interferometer.
The Michelson interferometer splits the incident wavelength with a
partially silvered mirror. The split beam travels down two separate paths, one fixed and
one variable. At the end of each
path is a mirror that reflects light and recombines such that the single beam
output is a superposition of the two wavelengths.
As the variable path length is changed, the superposition demonstrates
either destructive or constructive interference depending on the variable path
length. A path length of nl/2
results in constructive
interference because the light travels a length of 2L, as it goes back and forth
along the length of the path, to end up in phase with the other beam along the
fixed path. As the position of the
mirror varies, a sine wave is created as the signal alternates between
constructive and destructive interference. The data that resulted from the stepping of the mirror was
sent as a digital output to an oscilloscope.
The time scale on the oscilloscope represents the changing path length of
the variable mirror in the wavemeter. Calibration
was achieved knowing that the fringe spacing is l/2
for a single mode oscillation for 55mA at 636.78nm.
We used this calibration to look at our beats in the analysis (see data).

The above diagram shows both experimental set-ups used. The first did not include the spectrometer; the light from the laser was incident on the side of the wavemeter. For the second, the spectrometer intercepted and received the laser light for scanning.