My 2011-12 Sabbatical . . .

                   Yong Zhang (UNCC)

A Comparison of Photoluminescence Imaging and Confocal Photoluminescence Microscopy in the Study of Diffusion near Isolated Extended Defects in GaAs, Tim Gfroerer, Yong Zhang, and Mark Wanlass, 38th IEEE Photovoltaic Specialist Conference in Austin, TX (2012).